M927I
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The M927I integrated PIR sensor is made of a sensitive element
made by traditional silicate ceramic materials (PZT).
Essence The two -way communication of probes and
external controllers (µC) realizes the application of various
configuration working status. The sensitive element converts
the induced human mobile signal through a very high
impedance differential input circuit coupling input
digital signal conditioning IC. The digital IC chip is
converted into a digital signal through 14 -bit ADC,
which is convenient for subsequent signal processing
and logic control. Including control conditions such as detecting sensitivity, adjustment of trigger thresholds, after triggering the blind lock time, the number of time windows and algorithms of the signal pulse meter of trigger events, and the choice of the three working modes can be through the external controller (µC) from a single -line communication interface through a single -line communication interface. SERIN configures the internal register to implement. When digital probes are monitored daily continuous exercise sensing, µC does not need to wake up (enter the standby status to save power consumption); only when the digital probe detects the mobile human signal and meets the trigger conditions of advance configuration, the internal conditioning IC of the probe passes/ pass/ pass/ pass/ DOCI externally sends an interrupt wake -up instruction to the µC, and µC enters the working status (performs follow -up control action). According to the configuration working mode, 可C can also read regularly through the DOCI port or forcibly read the probe digital output value at any time, and then determine the subsequent execution of the control action by the µC through the self -calculation algorithm control condition. Thanks to interrupts to wake up this sufficient power -saving working mechanism, this digital sensing system is suitable for occasions with higher energy conservation requirements, especially the application of battery power supply. It is the most power -saving sensor control solution.
1. Digital signal processing, two -way communication with the controller;
2. Configure detection and trigger conditions and implement three different working modes to support the output of human mobile monitoring results and PIR data ADC filtering output;
3. The second -order Bartworth with built -in infrared sensor with a filter to block the input interference of other frequencies;
4. The inner inner inside of the infrared WeChat conditioning circuit is sealed in the electromagnetic shielding cover. Only the power supply and digital interface of the outer feet have the ability to resist radio frequency interference;
5. In -depth consideration of the system work mechanism to save power consumption, and the application of equipment for battery power supply;
6. Power supply voltage and temperature detection;
7. Power off the self -inspection work and quickly stable;
8. The sensitive element uses a typical silicate ceramic material (PZT), which contains trace lead (PB) elements.
1. Toys;
2. PIR exercise detection;
3. IoT sensor;
4. Invasion testing;
5. Digital photo frame;
6. Testing of place;
7. Sensing lights;
8. Indoor lights, corridors, stairs, etc. control;
9. TV, refrigerator, air conditioning;
10. Private alarm;
11. Network camera;
12. LAN monitor;
13.usb alarm;
14. Automotive anti -theft system.
4.1 maximum rated value
The electrical excessive stress that exceeds the parameters in the following table may cause permanent damage to the device, and the work that exceeds the maximum rated condition may affect the reliability of the device.
Parameter | Symbol | Minimum | Maximum | unit | |
Power supply voltage | VDD | -0.3 | 3.6 | V | 25℃ |
Pin voltage | Vnto | -0.3 | Vdd + 0.3 | V | 25℃ |
Pipe current | Into | -100 | 100 | mA | Single time / single pin |
Storage temperature | TST | -40 | 125 | ℃ | < 60% R.H |
Operating temperature | Toper | -40 | 70 | ℃ |
4.2 Electrical characteristics (Test conditions for typical values: TAMB=+25℃, VDD=+3V)
Parameter | Symbol | Minimum | Typical | Maximum | Unit | Remark |
Working conditions | ||||||
Working voltage | VDD | 1.5 | 3.6 | V | Just consistent with the supply voltage of µC | |
Work current, Vreg | IDD1 | 5 | 6.0 | µA | This product is not applicable | |
Work current, Vreg closed | IDD | 3 | 3.5 | µA | Applicable this product Vdd = 3V, no load | |
Enter parameter SERIN | ||||||
Enter low voltage | VIL | - 0.3 | 0.2Vdd | V | ||
Enter high voltage | VIH | 0.8Vdd | 0.3 + Vdd | V | Max V < 3.6V | |
Input Current Vss<Vin<Vdd | II | -1 | 1 | µA | Vss<Vin<Vdd | |
Digital clock low level time | tL | 200 | 0.1/ FCLK | nS/µS | Typical: 1-2µS | |
Digital clock high level time | tH | 200 | 0.1/ FCLK | nS/µS | Typical: 1-2µS | |
Data bit writing time | tBW | 2/FCLK - tH | 3/FCLK-- tH | µS | Typical: 80-90µS | |
Timeout | tWA | 16/FCLK | 17/FCLK | µS |
Output foot INT/DOCI-OUT | ||||||||||||
Enter low voltage | VIL | - 0.3 | 0.2Vdd | V | ||||||||
Enter high voltage | VIH | 0.8Vdd | 0.3 + Vdd | V | Max V < 3.6V | |||||||
Input Current | IDI | -1 | 1 | µA | ||||||||
Data readable establishment time | TDS | 4/FCLK | 5/FCLK | µS | ||||||||
Data position preparation time | TBs | 1 | µS | CLOAD < 10pF | ||||||||
Establishment time for compulsory reading | TFR | 4/FCLK | µS | |||||||||
Interrupt and clearing time | TCL | 4/FCLK | µS | |||||||||
Data clock low electricity is usually long | TL
| 200 | 0.1/ FCLK | nS/µS | Typical: 1-2µS | |||||||
Data clock high level is usually long | TH | 200 | 0.1/ FCLK | nS/µS | Typical: 1-2µS | |||||||
Data reading duration | Tbit | 24 | µS | Typical: 20-22µS | ||||||||
Reading timeout | TRA | 4/FCLK | µS | |||||||||
DOCI pulls down the time | TDU | 32/FCLK | µS | For data update | ||||||||
Input PIRIN/NPIRIN | ||||||||||||
PIRIN/NPIRIN toVss input resistance | 30 | 60 | GΩ | -60mV<Vin<60mV | ||||||||
Input resistance difference points | 60 | 120 | GΩ | -60mV<Vin<60mV | ||||||||
PIRIN Input voltage range | -53 | +53 | mV | |||||||||
Resolution/step | 6 | 6.5 | 7 | µV/Count | ||||||||
ADC Output Range | 511 | 2^14-511 | Counts | |||||||||
ADC bias | 7150 | 8130 | 9150 | Counts | ||||||||
ADC temperature coefficient | -600 | 600 | ppm/K | |||||||||
ADC input noise balance square root value F = 0.1Hz...10Hz | 52 | 91 | µVpp | f = 0.09...7Hz | ||||||||
Power supply voltage measurement | ||||||||||||
ADC Output Range | 2^13 | 2^14-511 | Counts | |||||||||
Voltage resolution | 590 | 650 | 720 | µV/Count | ||||||||
ADC bias @ 3V | 12600 | Counts | about ±10% offse | |||||||||
Temperature measurement (requires a single point calibration) | ||||||||||||
Resolution | 80 | Counts | ||||||||||
ADC Output Range | 511 | 2^14-511 | Counts/K | |||||||||
Partial value @ 298K | 8130 | Counts | about ±10% offse | |||||||||
Oscillator and filter | ||||||||||||
Low -pass filter dead frequency | FCLK*1.41/2048/π | Hz | 2 nd order BW | |||||||||
High -pass filter dead frequency | FCLK*P*1.41/32768/π | Hz | 2 nd order BW P = 1 or 0.5 | |||||||||
Frequency of oscillator on the film | Fosci | 60 | 64 | 72 | kHz | |||||||
System clock | FCLK | Fosci/2 | kHz |
Calculate the output signal of the strip or low pass (determined by the configuration) filter output signal. When the signal level exceeds the sensitivity threshold of the pre -configuration, a internal pulse will be generated. When the signal changes the symbol (or the configuration is not required to change the symbol) and exceeds the setting threshold again, the calculation of the subsequent pulse will be calculated. The condition of the output or alarm event such as the pulse and the counting time window of the pulse occurs. If the previous event is cleared by resetting interruption, stop any detection within the next -configured blind lock time. In the process setting of the application scenarios that requires high sensitivity detection, this feature is very important for preventing self -irritation from triggering.
The interrupt will be removed by driving a low level "0" by at least 120µs (tCL); then the processor can switch the port back to the high impedance state.
4.6 Serial interface and configurable register function description
The configuration of the conditioning IC control algorithm is that the controller is implemented by programming IC -related register programming through the Serin pin, and uses a simple clock data single -line communication protocol. The configuration data of the conditioning IC is read by the controller with INT/DOCI pin, and uses a similar clock data single -line output protocol. When Serin is at the low level of at least 16 system clocks (and VDD is in normal range), the probe internal conditioning IC starts to accept new data.
The following parameters can be adjusted by conditioning IC register:
1). Sensitivity [8-bits]
The sensitivity/detection threshold is defined by the storage value; the steering volume step is 6.5µV, and the threshold = the register value*6.5µV.
2). Blind lock time [4-bits]
After the output reset and switch back 0, ignore the shielding time of the motion detection:
Scope: 0.5s ~ 8s, blind lock time = register value*0.5s + 0.5s.
3). Pulse count in exercise detection [2-bits]
Scope: 1 ~ 4 pulses with (or no) symbol change, pulse number = register value +1.
4). Window in exercise detection [2-bits]
Scope: 2S ~ 8S, window time = register value*2s + 2s.
5). Sport detection startup [1-bit]
0 = Disable (closed), 1 = enable.
6). Interrupt source [1-bit]
The interrupt source can be selected between motion detection logic output or ADC output data filter extraction. If you choose to draw a filter, it will generate every 16 milliseconds
Over interruption, transmit a frame of effective original data.
0 = Movement detection, 1 = The original data output of the filter.
Turn off all interrupt outputs by setting the interrupt source to motion detection and turning off the motion detection function, and can only be forced by the controller to force the readings.
Pir Signal
Int SSP
Int MCU
4PIN Digital two -way communication PIR sensor m927i
7 Rev: A/2 2021.04.29
7) .ADC source selection [2-bits]
Reuse ADC resources. ADC's input terminal can be selected as follows: below:
PIR signal BFP, output = 0
PIR signal LPF, output = 1
Power voltage = 2
The temperature on the film = 3
*For sports detection mode, you must choose "0" or "1".
8). Built-in PYRO sensitive yuan stabilizer enables control (2.2V) [1-bit]
Provide a adjustable 2.2V: 0 = enable, 1 = unable to (disable) on the Vreg output; "1" must be selected when the product configuration must be disabled.
9). Self-test [1-bit]:
It takes 2 seconds to complete the PIR self -testing program for 2 seconds; the self -test function starts from the jump of 0 to 1; the application must be configured to 0 and it must not be changed in the middle.
10). Sample electricity value or Qualcomm deadline frequency select [1-bit]:
For different sizes of hot ceramic sensitive elements, you can choose different sample capacitors for hot ceramic tests; in the application, you can configure HPF Qualcomm cut -off frequency.
0 = 0.4Hz, 1 = 0.2Hz
11). Two inputs of short PIR [1-bit]
1 = short connection (measured ADC zero bias), 0 = normal use; the application must be configured to 0.
12). Movement detection pulse measuring algorithm mode [1-bit]
1 = Pulse directly count, 0 = neighboring pulse must be symbolic positive and negative in order to count
4.7 Configure the Serin communication protocol of the register
The configuration data is written in the internal conditioning IC by the controller through the Serin serialization. The external controller must input the conversion of 0 to 1 in the Serin input, and then write the values (0/1) in the same way; 1 "Time can be short (a instruction cycle of the controller). TBW requires at least two system clocks (TBIT) that needs to regulate IC, not more than three system clocks (TBIT) that regulates IC. The 25 -bit register data must be completely written in one -time; when the data bits are interrupted by a system clock (TWL) with more than 16 times during the transmission process, the last incomplete data received was locked into the internal register, and the interruption exceeded exceeded exceeding When the 5x system clock (TWL), the register may also enter the lock state and cannot continue to write.
SERIN input interface control time sequence diagram
Bit-No | Register | Remark |
[24:17] | [7:0] Sensitivity | The test threshold is defined according to 6.5µV. |
[16:13] | [3:0] Interrupt the blind lock time | The configuration time (0.5s ~ 8s); it is the blind lock period after the output reset |
[12:11] | [1:0] Pulse mixer | Trigger the number of pulses within the specified time window of the alarm incident |
[10:9] | [1: 0] Window time | In the configuration time window (2S ~ 8S), the number of measuring pulse reaching the values of advance configuration will trigger the alarm incident. |
[8] | [0] Start the motion detector | 0 = Disable, 1 = Enable |
[7] | [0] Interrupt source | 0 = Movement detection status, 1 = The original output status of the filter |
[6:5] | [1: 0] ADC/filter voltage source | 0 = pir (bpf); 1 = pir (lpf);2 = power supply voltage (LPF); 3 = temperature sensor (LPF) |
[4] | [1] The regulator is closed or enable | 0 = Open; 1 = Close. You must configure the bit to "1 'and close. |
[3] | [0] Start self -test | The jump of 0 to 1 Starts the PIR self -inspection process, write in the application 0. |
[2] | [0] Self -inspection capacitance size or HPF | 1 = 2 * Self -test default capacitance; in the application, you can configure Qualcomm HPF cut -off frequency: 0 = 0.4Hz, 1 = 0.2h. |
[1] | Two input terminals of short -connect PIR | 1 = short connection (measured ADC zero bias); 0 = normal use. |
[0] | Model selection of pulse measuring algorithm | 1 = Pulse direct count; 0 = Only reverse pulse can count. |
The storage value and corresponding parameters
4.8 Doci-Out communication protocol for data reading
The serial output of the conditioning IC on the controller is used as an interrupt output to indicate the motion; when used as a serial output, you can read the status and configuration data from the conditioning IC. During the duration of the equipment clock cycle (TFR), the DOCI is forced at high levels, and then reads the data bit according to the following timing diagram. Through forced DOCI feet to be "0" within at least 4 system clock cycles, it can be terminated at any time. After reading the data, µC should lower the DOCI and keep the low level of 32 times the system clock or above to ensure that the internal register data of the probe can be updated in a timely manner.
Bit-No | Register | Remark |
[39] | PIR ultra -range indicator | 0 means beyond the range, automatic short -connect discharge at both ends of the sensitive element |
[38:25] | [13: 0] PIR voltage output | LPF or BPF output voltage value, 6.5µV each step depends on the configuration |
[24:17] | [7: 0]Sensitivity | The test threshold is defined according to 6.5µV. |
[16:13] | [3: 0] Interrupt the blind lock time. | The configuration time (0.5s ~ 8s); the shielding period after the interrupt output reset ('H' change 'L') |
[12:11] | [1: 0] Pulse counter digitalizer | Trigger the number of pulses within the specified time window of the alarm incident |
[10:9] | [1: 0] Window time | In the specified time window (2S ~ 8S), the number of measuring pulse reaches the values of advance configuration will trigger the alarm incident |
[8] | [0] Start the motion detector | 0 = Disable, 1 = Enable |
[7] | [0] Interrupt source | 0 = Movement detection status, 1 = The original output status of the filter |
[6:5] | [1: 0] ADC/filter voltage source | 0 = pir (bpf); 1 = pir (LPF); 2 = power supply voltage (LPF); 3 = temperature (LPF) on the film (LPF) |
[4] | [1] The regulator is closed/enable | 0 = turn on/1 = turn off; it must be configured to be ‘1’ and turn off |
[3] | [0] Start self -test | The jump of 0 to 1 starts the PIR self -inspection process; the application is written in ‘0’ |
[2] | [0] Self -inspection capacitance size or HPF | 1 = 2 * Self -inspection default capacitance; in the application, you can configure Qualcomm HPF cut -off frequency: 0 = 0.4Hz, 1 = 0.2Hz |
[1] | Two input terminals of short -connect PIR | 1 = short connection (measured ADC zero bias); 0 = normal use |
[0] | Pulse metering algorithm mode selection | 1 = Pulse direct count; 0 = Only reverse pulse can count |
Register and corresponding parameters.
4.9 Calculation of measurement data
4.9.1. PIR output signal voltage measurement
a) Low -pass filter LPF output
ADC source [6: 5] must be switched to PIR input, and the digital LPF output needs to be selected (register configuration = 1).
Vpir = (ADC_ OUT -ADC_ Offset) * 6.5μV
b) Banding filter BPF output
ADC source [6: 5] must be switched to PIR input, and you need to select digital LPF & HPF (ie BPF) output (register configuration = 0).
Vpir = adc_ _out * 6.5HV.
4.9.2. Power voltage measurement
ADC source [6: 5] must be switched to the chip power supply (register configuration = 2).
Vdd = (adc_ _out -adc__offset) * 650 μV.
4.9.3. Film. Temperature measurement
ADC source [6: 5] must be switched to the temperature sensor (register configuration = 3).
Temperature = tcal + [adc_ _out -adc_ _offset (tcal)] / 80 * counts / k
ADC_ Offset = ADC value@ vin = 0, typical value = 2^13
ADC_ _offset (TCAL) = Define the ADC value at the ambient temperature, typical value = 8130 @ 298k.
M927I is a digital armal release of infrared infrared sensors that detect changes in infrared rays. It may not be detected for the heat source outside the human body, or the temperature of the heat source without heat source and movement. It is necessary to pay attention to the following matters, be sure to confirm performance and reliability through actual use status.
8.1 When detecting the heat source outside the human body, the sensor is easy to report.
• When small animals enter the detection range.
• When the sunlight, car headlights, incandescent lamps, etc., when the far -infrared light sensor of incandescent lamps, etc.
• Due to the temperature of the warm air, cold air, and humidifier of the cold temperature room equipment, the temperature in the detection area has changed drastically.
8.2 The phenomenon that cannot be detected.
• It is difficult to use glass, acryline, etc. between the sensors and the detection object.
• Within the detection range, when the heat source is almost free of action or when the ultra -high -speed movement.
8.3 In the case of the expansion of the detection area.
The surrounding environment temperature and the temperature difference between the human body (about 20 ° C), even outside of the specified detection range, sometimes there will be a wider case of detection area.
8.4 Precautions for other use.
• When there are stains on the window, it will affect the detection performance, so please pay attention.
• The lens of the probe is made of weak material (polyethylene). After applying a load or impact on the lens, it will cause instability or degradation due to deformation and damage, so please avoid the above situation.
• Electricity above ± 200V may cause damage. Therefore, be sure to pay attention when operating, avoid touching the touch directly with your hands.
• Frequent and excessive vibrations will cause the sensitive element of the sensor to break.
• When welding the PIN foot, the hand welding should be carried out below the temperature of the electric iron below 350 ° C and within 3 seconds. Welding through the welding slot may cause performance deterioration, please try to avoid it.
• Please avoid cleaning this sensor. Otherwise, the cleaning liquid invades the inside of the lens, which may cause the performance to deteriorate.
IX.Remarks:
The company reserves the right to regularly update this specification book without notifying customers in advance. The updated data manual will be issued to relevant customers in time.